Nanoindentation Testing Instruments
for nanomechanical materials characterization


In-Situ SPM Technology - Nanoindentation Measurement Principle - Surface Topography - Modulus Mapping -
Nanoindentation
- Nanoscratch Hardness - NanoScan 3D - NanoScan Compact - NanoScan Mini


Nanoscan 3D a Nanoindentation testing instrument with In-Situ SMP TechnologyNanoindentation Testing Instruments
Nanoindentation and nanoscratch testing are well-established techniques that provide surface mechanical information at the nanometer to micron scale. NanoScan is a manufacturer of nanoindentation test instruments used for advanced materials characterization. NanoScan instruments provide quantitative nanoindentation, nanowear, nanoscratch, topography, modulus mapping and electrical properties

In-Situ SPM Technology, One Head Provides Multiple Techniques:
The NanoScan instrument is unique among other nanoindentation testing systems. The NanoScan nanoindentation tester employs an In-Situ SPM technology to perform multiple techniques on a single measuring head, eliminating the daunting tasks associated with exchanging multiple sensors, ensures correlation between nanoindentation and ancillary modes of operation, and reduces time required for comprehensive nanomechanical experiments. With a single measuring head, our tester can acquire surface topography, nanoindentation, nanoscratch, modulus mapping, and electrical properties, providing true in-situ nanomechanical and topographic results.



Example of multiple in-situ Measurement Modes
Dental (Teeth Analysis)
 

Topography, Ra=40nm
Topography, Ra=40nm
 
Nanoindentation imprint
Nanoindentation imprint
 
Nano-scratch testing
Nano-scratch testing
 
Elasticity  map
Elasticity map
 

Nanoindentation Measurement Principle
The main feature of the NanoScan nanoindentation system is its probe sensor technology. The system utilizes a piezoceramic probe sensor/tuning fork with high bending stiffness.

The use of the resonance oscillation allows tracking of contact between the probe tip and surface with two parameters, change of amplitude and frequency of the cantilevers oscillation. This makes it possible to separate the viscous and elastic components of the tip-surface interaction, and distinguish an elastic surface and a viscous contamination layer on it, as well as to measure the mechanical properties of the surface.

High bending stiffness of the sensor is used to break through the viscous contamination layer until contact with the rigid surface is made, allowing nanoindentation or nanoscratching of the surface.

NanoScan’s unique sensor technology provides highly precise and accurate nanomechanical measurements including the following modes of operation:

surface topography

Surface topography
The system provides 3D topographic images with its In-Situ SPM imaging technology. The NanoScan tester provides higher resolution topography images compared to competitive nanoindentation systems, which require additional measuring heads to get similar results.

Modulus Mapping
The NanoScan system provides qualitative and quantitative elastic modulus information. Qualitative elastic modulus distribution maps of the surface are simultaneously acquired during surface topography scanning. This is ideal for the investigating of multiphase materials. The modulus map and topography image can be used to choose a precise location and perform nanomechanical testing.
Additionally, one can measure the numerical value of elastic modulus with submicron spatial resolution using force spectroscopy.

Nanoindentation
NanoScan provides quantitative instrumented nanoindentation for advanced materials characterization. The system provides the ability to quantify the contact areas directly with its unique In-Situ SPM measurement head.


Nanoscratch Hardness
Nanoscratch testing is a powerful tool when analyzing thin films. Nanoscratch testing is performed by applying a load in controlled manner while measuring the force required to laterally move the tip across the samples surface. The induced scatches are observed and measured by In-Situ SPM imaging.

Contact; Nanounity at info@nanounity.com for more information about the Nanoscan Nanoindentation Testing Instruments feel free to call us at (408) 235-8888.

NanoScan has a family of nanoindentation and nanomechanical test systems, covering a range of configurations and applications.

The NanoScan 3D

The Nanoscan 3D is an advanced materials characterization instrument. The system provides quantitative nanomechanical characterization, nanoindentation, force spectroscopy and electrical properties.

scratch test


NanoScan 3D Measurement Modes

  1. Imaging in contact dynamic scanning mode (topography / modulus mapping).
  2. Nanoindentation / nanoscratch
  3. Force spectroscopy
  4. Instrumented nanoindentation 
  5. Mapping local conductivity simultaneously with surface topography and elasticity imaging
  6. Measuring Current during instrumented indentation and scratch-test
  7. Measuring C-V curves at the predefined normal load/indentation penetration of the nanoindenter
  8. Lateral force during scratching and tribological tests. 

NanoScan 3D SPM imaging module specification

  1. XY imaging range: 100um x 100um or larger
  2. Z imaging range: 10um or larger
  3. Displacement nonlinearity: 1 % or less

NanoScan 3D Samples stage specification

  1. Maximum space for samples: 100mm x 100mm x 60mm (please inquire for larger platforms)
  2. Maximum weight of samples: 3 kg
  3. Samples positioning: motorized
  4. XY positioning range: 100mm x 100mm (please inquire for larger platforms)

NanoScan 3D Measuring head specifications

  1. Peak load for low-range sensor: 30-100 mN 
  2. Peak load for high-range sensor: 30 N
  3. Maximum indentation displacement: 10 um

NanoScan 3D Software 

  1. Full set of software necessary for device setup and operation, as well as data acquisition and analysis.

NanoScan 3D Accessories 

  1. Digital Camera for side view of the samples stage
  2. Unit for temperature control
  3. Probe sensor with mounted diamond indenter (2 pcs.)
  4. Linear calibration grating TGZ02
  5. Hardness reference block (fused quartz)

NanoScan 3D PC workstation

  1. IBM compatible personal computer.
  2. Operating system: Windows 7
  3. LCD display

NanoScan 3D Optical video-microscope module

  1. Optical microscope with manual zooming
  2. Effective magnification: 250x to 1700x
  3. FOV1.57mm x 2.09-0.13 x O.17mm
  4. CCD Camera
  5. CCD camera resolution: 2048 x 1536 or less

NanoScan 3D Vibration isolation platform

  1. Working weight range: 40-50 kg
  2. Vertical frequency in loaded state: 1 Hz or less
  3. Working area size: 440mm x 380mm or larger 

NanoScan 3D Acoustic enclosure

  1. Outside dimensions: 700mm x 680mm x 820mm
  2. Inside dimensions: 600mm x 550mm x 700mm
  3. Passive from noise and thermal effects 

NanoScan 3D Contact; Nanounity at info@nanounity.com for more information about the Nanoscan Nanoindentation Testing Instruments feel free to call us at (408) 235-8888.


The NanoScan Compact

Is a compact cost effective tester providing quantitative nanomechanical characterization, nanoindentation, force spectroscopy and electrical properties.

Nanoscan Compact
Nanoscan Compact

NanoScan Compact Measurement Modes

  1. Imaging in contact dynamic scanning mode (topography / modulus mapping)
  2. NanoIndentation / nanoscratch
  3. Force spectroscopy
  4. Mapping local conductivity simultaneously with surface topography and modulus mapping
  5. Measuring Current during instrumented nanoindentation and nanoscratch-test
  6. Measuring C-V curves at the predefined normal load/indentation penetration of the nanoindenter  

NanoScan Compact SPM imaging module specification

  1. XY imaging range: 100um x 100um or larger
  2. Z imaging range: 10um or larger
  3. Displacement nonlinearity: 1 % or less

NanoScan Compact Samples stage specification

  1. Maximum space for samples: 100mm x 100mm x 60mm (please inquire for larger platforms)
  2. Maximum weight of samples: 3 kg
  3. Samples positioning: motorized
  4. XY positioning range: 100mm x 100mm (please inquire for larger platforms)

NanoScan Compact Measuring head specifications

  1. Peak load for low-range sensor: 30-100 mN
  2. Maximum indentation displacement: 10um   

NanoScan Compact Accessories 

  1. Probe sensor with mounted diamond indenter (2 pcs.)
  2. Linear calibration grating TGZ02
  3. Hardness reference block (fused quartz)

NanoScan Compact PC workstation

  1. IBM compatible personal computer.
  2. Operating system: Windows 7 32bit / 64bit
  3. LCD display

NanoScan Compact Acoustic enclosure

  1. Outside dimensions: 450mm x 400mm x 450mm
  2. Inside dimensions: 370mm x 310mm x 400mm
  3. Passive from noise and thermal effects 

NanoScan Compact Contact; Nanounity at info@nanounity.com for more information about the Nanoscan Nanoindentation Testing Instruments feel free to call us at (408) 235-8888.


The NanoScan Mini

The NanoScan Mini Is a portable tester providing quantitative nanomechanical characterization, nanoindentation, force spectroscopy and electrical properties at an affordable price.

Nanoscan Compact
Nanoscan Mini
NanoScan Mini Measurement Modes

  1. Imaging in contact dynamic scanning mode (topography / modulus mapping).
  2. Nanoindentation / nanoscratch
  3. Force spectroscopy
  4. Mapping local conductivity simultaneously with surface topography and elasticity imaging
  5. Measuring Current during instrumented nanoindentation and nanoscratch-test
  6. Measuring C-V curves at the predefined normal load/indentation penetration of the nanoindenter  

NanoScan Mini Samples stage specification

  1. Maximum space for samples: 50mm x 50mm x 20mm
  2. Maximum weight of samples: 200mg
  3. Samples positioning: manual

NanoScan Mini Measuring head specifications

  1. Peak load for low-range sensor: 30-100 mN 
  2. Peak Load for high-range sensor: 3 uN 
  3. Maximum indentation displacement: 50 um, up to 250 um on request

NanoScan Mini Software 

  1. Full set of software necessary for device setup and operation, as well as data acquisition and analysis.
  2. User manual

NanoScan Mini Accessories 

  1. Probe sensor with mounted diamond indenter (2 pcs.)
  2. Hardness reference block (fused quartz)

NanoScan Mini PC workstation

  1. IBM compatible personal computer.
  2. Operating system: Windows 7 32bit / 64bit 
  3. LCD display

NanoScan Mini Contact; Nanounity at info@nanounity.com for more information about the Nanoscan Nanoindentation Testing Instruments feel free to call us at (408) 235-8888.