NT-MDT AFM probes and accessories are available from Nanounity beginning February 2010. Nanounity and NT-MDT partnered in 2008 expanding AFM instrumentation distribution in the U.S. region. With this latest development, customers now have a dedicated source for NT-MDT instruments and probes.
NT-MDT AFM probes, NSOM fibers, calibration gratings and samples can be purchased at our online probe store, or with a purchase order by fax or email. The NT-MDT probes and accessories will be posted to the probe store over the coming weeks. If the probe you need is not posted yet, please feel free to call on us for personal assistance with your order.
ionscope Ltd. launched a new website in January 2010. The new site was created as an informational resource on scanning ion conductance microscopy (SICM). The site describes the advantages of the technology for high resolution live cell imaging and liquid scanning. The media library has many images and video files of various live cell applications. The new site can be visited at www.ionscope.com.
NT-MDT is pleased to announce their new Quartz Crystal Microbalance Dissipation monitor (QCM-D) integrated with AFM. The combined system offers simultaneous observation of changes to the sample surface topography and mass. The unique platform provides greater insight from a single instrument. For mor information please visit our NT-MDT product page or contact us directly.
Nanoscale live cell imaging using hopping probe ion conductance microscopy, was published in this month edition of Nature Methods, the paper by Pavel Novak and contributors from Imperial College of London, Cambridge University and University of Kentucky, demonstrates live cell imaging at the nanoscale, without contact or force applied to the sample. The development of hopping probe ion conductance microscopy enables imaging of living samples that are not flat. HPICM opens the door to imaging complex biological samples at nanoscale resolution and can be combined with fluorescent imaging or other functional test such as single ion channel patch clamping. An abstract of the article can be found here http://www.nature.com/nmeth/index.html. For more detail on scanning ion conductance microscopy visit ionscope Ltd. http://www.ionscope.com/.
Bob Monteverde recently joined Nanounity to head sales in the western U.S. Bob brings over 26 years experience from various high technology sectors including MEMS, semiconductor and optical metrology. He was a co-founder of VLSI Standards, a company that makes physical reference standards for various measurement instruments and tools. His prior experience as a sales and marketing excutive will be a great asset to Nanounity and our customers. Please join us in welcoming Bob. If you are in the western U.S. you can reach him at bob.monteverde@nanounity.com.