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TGZ1

$100.00

The NT-MDT TGZ1 test grating is intended for calibration in the Z axis and non-linearity measurements. The grating is made of silicon and silicon dioxide, with a 1-Dimensional pattern (in the Z axis direction), step height of 18.5nm and the period is 3.0 microns.

Add to Cart:

  • Model: TGZ1
  • Shipping Weight: 0.25lbs
  • Manufactured by: NT-MDT


This product was added to our catalog on Thursday 25 February, 2010.


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